| 2008 |
|---|
| 5 | EE | B. Straka,
Hans A. R. Manhaeve,
J. Brenkus,
Stefaan Kerckenaere:
Theoretical and Practical Aspects of IDDQ Settling-Impact on Measurement Timing and Quality.
DATE 2008: 1310-1315 |
| 2000 |
|---|
| 4 | EE | Hans A. R. Manhaeve,
Johan Verfaillie,
B. Straka,
J. P. Cornil:
Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology.
J. Electronic Testing 16(3): 227-234 (2000) |
| 1998 |
|---|
| 3 | EE | B. Straka,
Hans A. R. Manhaeve,
Jozef Vanneuville,
M. Svajda:
A Fully Digital Controlled Off-Chip IDDQ Measurement Unit.
DATE 1998: 495-500 |
| 2 | EE | M. Svajda,
B. Straka,
Hans A. R. Manhaeve:
IOCIMU - An Integrated Off-Chip IDDQ Measurement Unit.
DATE 1998: 959-960 |
| 1997 |
|---|
| 1 | EE | M. Svajda,
B. Straka,
Hans A. R. Manhaeve:
A monolithic off-chip IDDQ monitor.
ED&TC 1997: 629 |
