Johan Verfaillie

2000
2	EE	Hans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil: Application of Supply Current Testing to Analogue Circuits, Towards a Structural Analogue Test Methodology. J. Electronic Testing 16(3): 227-234 (2000)
1996
1	EE	Johan Verfaillie, Didier Haspeslagh: A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI. J. Electronic Testing 9(1-2): 109-115 (1996)

Coauthor Index

1	J. P. Cornil	[2]
2	Didier Haspeslagh	[1]
3	Hans A. R. Manhaeve	[2]
4	B. Straka	[2]

Colors in the list of coauthors