Saurabh Patel
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2006
1
EE
Ali Chehab
, Saurabh Patel,
Rafic Z. Makki
: Scaling of i
DDT
Test Methods for Random Logic Circuits.
J. Electronic Testing 22
(1): 11-22 (2006)
Coauthor
Index
1
Ali Chehab
[
1
]
2
Rafic Z. Makki
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
