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1995 | ||
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2 | Rafic Z. Makki, Shyang-Tai Su, Troy Nagle: Transient Power Supply Current Testing of Digital CMOS Circuits. ITC 1995: 892-901 | |
1 | EE | Shyang-Tai Su, Rafic Z. Makki, Troy Nagle: Transient power supply current monitoring - A new test method for CMOS VLSI circuits. J. Electronic Testing 6(1): 23-43 (1995) |
1 | Rafic Z. Makki | [1] [2] |
2 | Shyang-Tai Su | [1] [2] |