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Troy Nagle

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1995
2 Rafic Z. Makki, Shyang-Tai Su, Troy Nagle: Transient Power Supply Current Testing of Digital CMOS Circuits. ITC 1995: 892-901
1EEShyang-Tai Su, Rafic Z. Makki, Troy Nagle: Transient power supply current monitoring - A new test method for CMOS VLSI circuits. J. Electronic Testing 6(1): 23-43 (1995)

Coauthor Index

1Rafic Z. Makki [1] [2]
2Shyang-Tai Su [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)