| |
| 1995 | ||
|---|---|---|
| 3 | Rafic Z. Makki, Shyang-Tai Su, Troy Nagle: Transient Power Supply Current Testing of Digital CMOS Circuits. ITC 1995: 892-901 | |
| 2 | EE | Shyang-Tai Su, Rafic Z. Makki, Troy Nagle: Transient power supply current monitoring - A new test method for CMOS VLSI circuits. J. Electronic Testing 6(1): 23-43 (1995) |
| 1992 | ||
| 1 | EE | Shyang-Tai Su, Rafic Z. Makki: Testing of static random access memories by monitoring dynamic power supply current. J. Electronic Testing 3(3): 265-278 (1992) |
| 1 | Rafic Z. Makki | [1] [2] [3] |
| 2 | Troy Nagle | [2] [3] |