2008 |
16 | EE | T. Y. Lin,
A. Zadeh:
Foreword to the Special Section on Granular Computing.
IEEE T. Fuzzy Systems 16(2): 282-284 (2008) |
2007 |
15 | EE | Xinying Xu,
Gaowei Yan,
Keming Xie,
T. Y. Lin:
Immune Evolution Algorithm Based Dynamic Path Planning Approach for the Soccer Robot.
GrC 2007: 477-480 |
14 | EE | Jun Xie,
Gaowei Yan,
Keming Xie,
T. Y. Lin:
Neuro-Fuzzy Model-Based CUSUM Method Application in Fault Detection on an Autonomous Vehicle.
GrC 2007: 548-551 |
13 | EE | T. Y. Lin:
Granular Computing and Web Processing: Representing Documents in Polyhedron.
GrC 2007: 6 |
12 | EE | Jianchao Han,
T. Y. Lin,
Jiye Li,
Nick Cercone:
Constructing Associative Classifiers from Decision Tables.
RSFDGrC 2007: 305-313 |
2005 |
11 | EE | Priya Baliga,
T. Y. Lin:
Kolmogorov complexity based automata modeling for intrusion detection.
GrC 2005: 387-392 |
10 | EE | Churn-Jung Liau,
T. Y. Lin:
Reasoning about relational granulation in modal logics.
GrC 2005: 530-534 |
9 | EE | Wesley W. Chu,
T. Y. Lin:
Introduction.
Appl. Intell. 22(1): 7 (2005) |
8 | EE | Y. F. Yao,
B. Njoman,
K. H. Chua,
T. Y. Lin:
New encapsulation development for fine pitch IC devices.
Microelectronics Reliability 45(7-8): 1222-1229 (2005) |
2004 |
7 | EE | T. Y. Lin,
B. Njoman,
D. Crouthamel,
K. H. Chua,
S. Y. Teo,
Y. Y. Ma:
The impact of moisture in mold compound preforms on the warpage of PBGA packages.
Microelectronics Reliability 44(4): 603-609 (2004) |
2003 |
6 | EE | Y. F. Yao,
T. Y. Lin,
K. H. Chua:
Improving the deflection of wire bonds in stacked chip scale package (CSP).
Microelectronics Reliability 43(12): 2039-2045 (2003) |
5 | EE | T. Y. Lin,
K. L. Davison,
W. S. Leong,
Simon Chua,
Y. F. Yao,
J. S. Pan,
J. W. Chai,
K. C. Toh,
W. C. Tjiu:
Surface topographical characterization of silver-plated film on the wedge bondability of leaded IC packages.
Microelectronics Reliability 43(5): 803-809 (2003) |
4 | EE | T. Y. Lin,
C. M. Fang,
Y. F. Yao,
K. H. Chua:
Development of the green plastic encapsulation for high density wirebonded leaded packages.
Microelectronics Reliability 43(5): 811-817 (2003) |
2002 |
3 | EE | T. Y. Lin,
W. S. Leong,
K. H. Chua,
R. Oh,
Y. Miao,
J. S. Pan,
J. W. Chai:
The impact of copper contamination on the quality of the second wire bonding process using X-ray photoelectron spectroscopy method.
Microelectronics Reliability 42(3): 375-380 (2002) |
2001 |
2 | EE | T. Y. Lin,
Vladik Kreinovich:
A Special Session on Granular Computing and Interval Computations at the 19th International Conference of the North American Fuzzy Information Processing Society (NAFIPS) Atlanta, Georgia, July 13-15, 2000.
Reliable Computing 7(1): 71-72 (2001) |
1988 |
1 | EE | T. Y. Lin:
Neighborhood systems and relational databases.
ACM Conference on Computer Science 1988: 725 |