2005 |
4 | EE | John U. Knickerbocker,
Paul S. Andry,
L. Paivikki Buchwalter,
Alina Deutsch,
Raymond R. Horton,
Keith A. Jenkins,
Young Hoon Kwark,
Gerald McVicker,
Chirag S. Patel,
Robert J. Polastre,
Christian D. Schuster,
Arun Sharma,
Sri M. Sri-Jayantha,
Christopher W. Surovic,
Cornelia K. Tsang,
Buck C. Webb,
Steven L. Wright,
Samuel R. McKnight,
Edmund J. Sprogis,
Bing Dang:
Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection.
IBM Journal of Research and Development 49(4-5): 725-754 (2005) |
1998 |
3 | EE | Evan G. Colgan,
Paul M. Alt,
Robert L. Wisnieff,
Peter M. Fryer,
Eileen A. Galligan,
William S. Graham,
Paul F. Greier,
Raymond R. Horton,
Harold Ifill,
Leslie C. Jenkins,
Richard A. John,
Richard I. Kaufman,
Yue Kuo,
Alphonso P. Lanzetta,
Kenneth F. Latzko,
Frank R. Libsch,
Shui-Chih Alan Lien,
Steven E. Millman,
Robert W. Nywening,
Robert J. Polastre,
Carl G. Powell,
Rick A. Rand,
John J. Ritsko,
Mary B. Rothwell,
John L. Staples,
Kevin W. Warren,
John S. Wilson,
Steven L. Wright:
A 10.5-in.-diagonal SXGA active-matrix display.
IBM Journal of Research and Development 42(3): 427-444 (1998) |
2 | EE | Evan G. Colgan,
Robert J. Polastre,
Masatomo Takeichi,
Robert L. Wisnieff:
Thin-film-transistor process-characterization test structures.
IBM Journal of Research and Development 42(3): 481-490 (1998) |
1992 |
1 | | Leslie C. Jenkins,
Robert J. Polastre,
Ronald R. Troutman,
Robert L. Wisnieff:
Functional testing of TFT/LCD arrays.
IBM Journal of Research and Development 36(1): 59-68 (1992) |