2009 |
13 | EE | Javid Jaffari,
Mohab Anis:
Timing yield estimation of digital circuits using a control variate technique.
ISQED 2009: 382-387 |
2008 |
12 | EE | Javid Jaffari,
Mohab Anis:
On efficient Monte Carlo-based statistical static timing analysis of digital circuits.
ICCAD 2008: 196-203 |
11 | EE | Rodrigo Jaramillo-Ramirez,
Javid Jaffari,
Mohab Anis:
Variability-aware design of subthreshold devices.
ISCAS 2008: 1196-1199 |
10 | EE | Rizwan Mudassir,
Mohab Anis,
Javid Jaffari:
Switching activity reduction in low power Booth multiplier.
ISCAS 2008: 3306-3309 |
9 | EE | Javid Jaffari,
Mohab Anis:
Variability-Aware Bulk-MOS Device Design.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(2): 205-216 (2008) |
8 | EE | Javid Jaffari,
Mohab Anis:
Statistical Thermal Profile Considering Process Variations: Analysis and Applications.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(6): 1027-1040 (2008) |
7 | EE | Javid Jaffari,
Mohab Anis:
Thermal Driven Placement for Island-style MTCMOS FPGAs.
JCP 3(4): 24-30 (2008) |
2007 |
6 | EE | Javid Jaffari,
Mohab Anis:
Thermal-Aware Placement for FPGAs Using Electrostatic Charge Model.
ISQED 2007: 666-671 |
5 | EE | Shervin Sharifi,
Javid Jaffari,
Mohammad Hosseinabady,
Ali Afzali-Kusha,
Zainalabedin Navabi:
Simultaneous Reduction of Dynamic and Static Power in Scan Structures
CoRR abs/0710.4653: (2007) |
2006 |
4 | EE | Javid Jaffari,
Mohab Anis:
Variability-aware device optimization under ION and leakage current constraints.
ISLPED 2006: 119-122 |
3 | EE | Shervin Sharifi,
Javid Jaffari,
Mohammad Hosseinabady,
Ali Afzali-Kusha,
Zainalabedin Navabi:
Scan-Based Structure with Reduced Static and Dynamic Power Consumption.
J. Low Power Electronics 2(3): 477-487 (2006) |
2005 |
2 | EE | Shervin Sharifi,
Javid Jaffari,
Mohammad Hosseinabady,
Ali Afzali-Kusha,
Zainalabedin Navabi:
Simultaneous Reduction of Dynamic and Static Power in Scan Structures.
DATE 2005: 846-851 |
2004 |
1 | EE | A. Amirabadi,
Javid Jaffari,
Ali Afzali-Kusha,
Mehrdad Nourani,
Ali Khaki-Firooz:
Leakage current reduction by new technique in standby mode.
ACM Great Lakes Symposium on VLSI 2004: 158-161 |