Takashi Mochiyama

2004
2	EE	Daisuke Maruyama, Akira Kanuma, Takashi Mochiyama, Hiroaki Komatsu, Yaroku Sugiyama, Noriyuki Ito: Detection of multiple transitions in delay fault test of SPARC64 microprocessor. ICCAD 2004: 893-898
2003
1	EE	Takahisa Hiraide, Kwame Osei Boateng, Hideaki Konishi, Koichi Itaya, Michiaki Emori, Hitoshi Yamanaka, Takashi Mochiyama: BIST-Aided Scan Test - A New Method for Test Cost Reduction. VTS 2003: 359-364

Coauthor Index

1	Kwame Osei Boateng	[1]
2	Michiaki Emori	[1]
3	Takahisa Hiraide	[1]
4	Koichi Itaya	[1]
5	Noriyuki Ito	[2]
6	Akira Kanuma	[2]
7	Hiroaki Komatsu	[2]
8	Hideaki Konishi	[1]
9	Daisuke Maruyama	[2]
10	Yaroku Sugiyama	[2]
11	Hitoshi Yamanaka	[1]