| 2005 |
|---|
| 5 | EE | G. Ghidini,
M. Langenbuch,
R. Bottini,
D. Brazzelli,
A. Ghetti,
N. Galbiati,
G. Giusto,
A. Garavaglia:
Impact of interface and bulk trapped charges on transistor reliability.
Microelectronics Reliability 45(5-6): 857-860 (2005) |
| 2003 |
|---|
| 4 | EE | G. Ghidini,
A. Garavaglia,
G. Giusto,
A. Ghetti,
R. Bottini,
D. Peschiaroli,
M. Scaravaggi,
F. Cazzaniga,
D. Ielmini:
Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET.
Microelectronics Reliability 43(8): 1221-1227 (2003) |
| 3 | EE | A. Ghetti,
D. Brazzelli,
A. Benvenuti,
G. Ghidini,
A. Pavan:
Anomalous gate oxide conduction on isolation edges: analysis and process optimization.
Microelectronics Reliability 43(8): 1229-1235 (2003) |
| 2002 |
|---|
| 2 | EE | E. Viganò,
A. Ghetti,
G. Ghidini,
A. S. Spinelli:
Post-breakdown characterization in thin gate oxides.
Microelectronics Reliability 42(9-11): 1491-1496 (2002) |
| 2001 |
|---|
| 1 | | A. Ghetti,
M. Alam,
J. Bude:
Anode hole generation mechanisms.
Microelectronics Reliability 41(9-10): 1347-1354 (2001) |
