| 2005 |
|---|
| 3 | EE | G. Ghidini,
M. Langenbuch,
R. Bottini,
D. Brazzelli,
A. Ghetti,
N. Galbiati,
G. Giusto,
A. Garavaglia:
Impact of interface and bulk trapped charges on transistor reliability.
Microelectronics Reliability 45(5-6): 857-860 (2005) |
| 2 | EE | G. Ghidini,
C. Capolupo,
G. Giusto,
A. Sebastiani,
B. Stragliati,
M. Vitali:
Tunnel oxide degradation under pulsed stress.
Microelectronics Reliability 45(9-11): 1337-1342 (2005) |
| 2003 |
|---|
| 1 | EE | G. Ghidini,
A. Garavaglia,
G. Giusto,
A. Ghetti,
R. Bottini,
D. Peschiaroli,
M. Scaravaggi,
F. Cazzaniga,
D. Ielmini:
Impact of gate stack process on conduction and reliability of 0.18 mum PMOSFET.
Microelectronics Reliability 43(8): 1221-1227 (2003) |
