A. S. Spinelli

2002
2	EE	E. Viganò, A. Ghetti, G. Ghidini, A. S. Spinelli: Post-breakdown characterization in thin gate oxides. Microelectronics Reliability 42(9-11): 1491-1496 (2002)
2001
1	EE	R. Clerc, A. S. Spinelli, G. Ghibaudo, C. Leroux, G. Pananakakis: Electrical characterization and quantum modeling of MOS capacitors with ultra-thin oxides (1.4-3 nm). Microelectronics Reliability 41(7): 1027-1030 (2001)

Coauthor Index

1	R. Clerc	[1]
2	A. Ghetti	[2]
3	G. Ghibaudo	[1]
4	G. Ghidini	[2]
5	C. Leroux	[1]
6	G. Pananakakis	[1]
7	E. Viganò	[2]

Colors in the list of coauthors