| 2005 |
|---|
| 4 | EE | G. Ghidini,
M. Langenbuch,
R. Bottini,
D. Brazzelli,
A. Ghetti,
N. Galbiati,
G. Giusto,
A. Garavaglia:
Impact of interface and bulk trapped charges on transistor reliability.
Microelectronics Reliability 45(5-6): 857-860 (2005) |
| 2003 |
|---|
| 3 | EE | A. Ghetti,
D. Brazzelli,
A. Benvenuti,
G. Ghidini,
A. Pavan:
Anomalous gate oxide conduction on isolation edges: analysis and process optimization.
Microelectronics Reliability 43(8): 1229-1235 (2003) |
| 2002 |
|---|
| 2 | EE | G. Ghidini,
D. Brazzelli:
Evaluation methodology of thin dielectrics for non-volatile memory application.
Microelectronics Reliability 42(9-11): 1473-1480 (2002) |
| 2001 |
|---|
| 1 | EE | D. Brazzelli,
G. Ghidini,
C. Riva:
Optimization of WSi2 by SiH4 CVD: impact on oxide quality.
Microelectronics Reliability 41(7): 1003-1006 (2001) |
