| |
| 2005 | ||
|---|---|---|
| 2 | EE | G. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia: Impact of interface and bulk trapped charges on transistor reliability. Microelectronics Reliability 45(5-6): 857-860 (2005) |
| 2001 | ||
| 1 | EE | N. Galbiati, G. Ghidini, C. Cremonesi, L. Larcher: Impact of the As dose in 0.35 mum EEPROM technology: characterization and modeling. Microelectronics Reliability 41(7): 999-1002 (2001) |
| 1 | R. Bottini | [2] |
| 2 | D. Brazzelli | [2] |
| 3 | C. Cremonesi | [1] |
| 4 | A. Garavaglia | [2] |
| 5 | A. Ghetti | [2] |
| 6 | G. Ghidini | [1] [2] |
| 7 | G. Giusto | [2] |
| 8 | M. Langenbuch | [2] |
| 9 | L. Larcher | [1] |