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N. Galbiati

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2005
2EEG. Ghidini, M. Langenbuch, R. Bottini, D. Brazzelli, A. Ghetti, N. Galbiati, G. Giusto, A. Garavaglia: Impact of interface and bulk trapped charges on transistor reliability. Microelectronics Reliability 45(5-6): 857-860 (2005)
2001
1EEN. Galbiati, G. Ghidini, C. Cremonesi, L. Larcher: Impact of the As dose in 0.35 mum EEPROM technology: characterization and modeling. Microelectronics Reliability 41(7): 999-1002 (2001)

Coauthor Index

1R. Bottini [2]
2D. Brazzelli [2]
3C. Cremonesi [1]
4A. Garavaglia [2]
5A. Ghetti [2]
6G. Ghidini [1] [2]
7G. Giusto [2]
8M. Langenbuch [2]
9L. Larcher [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)