2003 | ||
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1 | EE | A. Ghetti, D. Brazzelli, A. Benvenuti, G. Ghidini, A. Pavan: Anomalous gate oxide conduction on isolation edges: analysis and process optimization. Microelectronics Reliability 43(8): 1229-1235 (2003) |
1 | D. Brazzelli | [1] |
2 | A. Ghetti | [1] |
3 | G. Ghidini | [1] |
4 | A. Pavan | [1] |