| 2003 |
|---|
| 4 | EE | S. Aresu,
Ward De Ceuninck,
G. Knuyt,
J. Mertens,
J. Manca,
Luc De Schepper,
Robin Degraeve,
Ben Kaczer,
Marc D'Olieslaeger,
Jan D'Haen:
A new method for the analysis of high-resolution SILC data.
Microelectronics Reliability 43(9-11): 1483-1488 (2003) |
| 2002 |
|---|
| 3 | EE | R. Petersen,
Ward De Ceuninck,
Jan D'Haen,
Marc D'Olieslaeger,
Luc De Schepper,
O. Vendier,
H. Blanck,
D. Pons:
Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology.
Microelectronics Reliability 42(9-11): 1359-1363 (2002) |
| 2 | EE | E. Andries,
R. Dreesen,
K. Croes,
Ward De Ceuninck,
Luc De Schepper,
Guido Groeseneken,
K. F. Lo,
Marc D'Olieslaeger,
Jan D'Haen:
Statistical aspects of the degradation of LDD nMOSFETs.
Microelectronics Reliability 42(9-11): 1409-1413 (2002) |
| 1 | EE | S. Aresu,
Ward De Ceuninck,
R. Dreesen,
K. Croes,
E. Andries,
J. Manca,
Luc De Schepper,
Robin Degraeve,
Ben Kaczer,
Marc D'Olieslaeger:
High-resolution SILC measurements of thin SiO2 at ultra low voltages.
Microelectronics Reliability 42(9-11): 1485-1489 (2002) |
