| |
| 2002 | ||
|---|---|---|
| 1 | EE | R. Petersen, Ward De Ceuninck, Jan D'Haen, Marc D'Olieslaeger, Luc De Schepper, O. Vendier, H. Blanck, D. Pons: Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. Microelectronics Reliability 42(9-11): 1359-1363 (2002) |
| 1 | Ward De Ceuninck | [1] |
| 2 | Jan D'Haen | [1] |
| 3 | Marc D'Olieslaeger | [1] |
| 4 | R. Petersen | [1] |
| 5 | D. Pons | [1] |
| 6 | Luc De Schepper | [1] |
| 7 | O. Vendier | [1] |