S. Aresu

2003
2	EE	S. Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen: A new method for the analysis of high-resolution SILC data. Microelectronics Reliability 43(9-11): 1483-1488 (2003)
2002
1	EE	S. Aresu, Ward De Ceuninck, R. Dreesen, K. Croes, E. Andries, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger: High-resolution SILC measurements of thin SiO2 at ultra low voltages. Microelectronics Reliability 42(9-11): 1485-1489 (2002)

Coauthor Index

1	E. Andries	[1]
2	Ward De Ceuninck	[1] [2]
3	K. Croes	[1]
4	Jan D'Haen	[2]
5	Marc D'Olieslaeger	[1] [2]
6	Robin Degraeve	[1] [2]
7	R. Dreesen	[1]
8	Ben Kaczer	[1] [2]
9	G. Knuyt	[2]
10	J. Manca	[1] [2]
11	J. Mertens	[2]
12	Luc De Schepper	[1] [2]