![]() | ![]() |
2003 | ||
---|---|---|
2 | EE | S. Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen: A new method for the analysis of high-resolution SILC data. Microelectronics Reliability 43(9-11): 1483-1488 (2003) |
2002 | ||
1 | EE | S. Aresu, Ward De Ceuninck, R. Dreesen, K. Croes, E. Andries, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger: High-resolution SILC measurements of thin SiO2 at ultra low voltages. Microelectronics Reliability 42(9-11): 1485-1489 (2002) |
1 | E. Andries | [1] |
2 | Ward De Ceuninck | [1] [2] |
3 | K. Croes | [1] |
4 | Jan D'Haen | [2] |
5 | Marc D'Olieslaeger | [1] [2] |
6 | Robin Degraeve | [1] [2] |
7 | R. Dreesen | [1] |
8 | Ben Kaczer | [1] [2] |
9 | G. Knuyt | [2] |
10 | J. Manca | [1] [2] |
11 | J. Mertens | [2] |
12 | Luc De Schepper | [1] [2] |