| |
| 2002 | ||
|---|---|---|
| 1 | EE | E. Andries, R. Dreesen, K. Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen: Statistical aspects of the degradation of LDD nMOSFETs. Microelectronics Reliability 42(9-11): 1409-1413 (2002) |
| 1 | E. Andries | [1] |
| 2 | Ward De Ceuninck | [1] |
| 3 | K. Croes | [1] |
| 4 | Jan D'Haen | [1] |
| 5 | Marc D'Olieslaeger | [1] |
| 6 | R. Dreesen | [1] |
| 7 | Guido Groeseneken | [1] |
| 8 | Luc De Schepper | [1] |