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2002 | ||
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2 | EE | E. Andries, R. Dreesen, K. Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen: Statistical aspects of the degradation of LDD nMOSFETs. Microelectronics Reliability 42(9-11): 1409-1413 (2002) |
1 | EE | S. Aresu, Ward De Ceuninck, R. Dreesen, K. Croes, E. Andries, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger: High-resolution SILC measurements of thin SiO2 at ultra low voltages. Microelectronics Reliability 42(9-11): 1485-1489 (2002) |
1 | S. Aresu | [1] |
2 | Ward De Ceuninck | [1] [2] |
3 | K. Croes | [1] [2] |
4 | Jan D'Haen | [2] |
5 | Marc D'Olieslaeger | [1] [2] |
6 | Robin Degraeve | [1] |
7 | R. Dreesen | [1] [2] |
8 | Guido Groeseneken | [2] |
9 | Ben Kaczer | [1] |
10 | K. F. Lo | [2] |
11 | J. Manca | [1] |
12 | Luc De Schepper | [1] [2] |