E. Andries

2002
2	EE	E. Andries, R. Dreesen, K. Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen: Statistical aspects of the degradation of LDD nMOSFETs. Microelectronics Reliability 42(9-11): 1409-1413 (2002)
1	EE	S. Aresu, Ward De Ceuninck, R. Dreesen, K. Croes, E. Andries, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger: High-resolution SILC measurements of thin SiO2 at ultra low voltages. Microelectronics Reliability 42(9-11): 1485-1489 (2002)

Coauthor Index

1	S. Aresu	[1]
2	Ward De Ceuninck	[1] [2]
3	K. Croes	[1] [2]
4	Jan D'Haen	[2]
5	Marc D'Olieslaeger	[1] [2]
6	Robin Degraeve	[1]
7	R. Dreesen	[1] [2]
8	Guido Groeseneken	[2]
9	Ben Kaczer	[1]
10	K. F. Lo	[2]
11	J. Manca	[1]
12	Luc De Schepper	[1] [2]