| |
| 2003 | ||
|---|---|---|
| 1 | EE | S. Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen: A new method for the analysis of high-resolution SILC data. Microelectronics Reliability 43(9-11): 1483-1488 (2003) |
| 1 | S. Aresu | [1] |
| 2 | Ward De Ceuninck | [1] |
| 3 | Jan D'Haen | [1] |
| 4 | Marc D'Olieslaeger | [1] |
| 5 | Robin Degraeve | [1] |
| 6 | Ben Kaczer | [1] |
| 7 | G. Knuyt | [1] |
| 8 | J. Manca | [1] |
| 9 | Luc De Schepper | [1] |