| 2006 |
|---|
| 3 | EE | A. Crunteanu,
A. Pothier,
P. Blondy,
F. Dumas-Bouchiat,
C. Champeaux,
A. Catherinot,
P. Tristant,
O. Vendier,
C. Drevon,
J. L. Cazaux:
Gamma radiation effects on RF MEMS capacitive switches.
Microelectronics Reliability 46(9-11): 1741-1746 (2006) |
| 2005 |
|---|
| 2 | EE | S. Mellé,
D. De Conto,
L. Mazenq,
D. Dubuc,
B. Poussard,
C. Bordas,
K. Grenier,
L. Bary,
O. Vendier,
J. L. Muraro:
Failure predictive model of capacitive RF-MEMS.
Microelectronics Reliability 45(9-11): 1770-1775 (2005) |
| 2002 |
|---|
| 1 | EE | R. Petersen,
Ward De Ceuninck,
Jan D'Haen,
Marc D'Olieslaeger,
Luc De Schepper,
O. Vendier,
H. Blanck,
D. Pons:
Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology.
Microelectronics Reliability 42(9-11): 1359-1363 (2002) |
