Jan D'Haen

2003
3	EE	S. Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, J. Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen: A new method for the analysis of high-resolution SILC data. Microelectronics Reliability 43(9-11): 1483-1488 (2003)
2002
2	EE	R. Petersen, Ward De Ceuninck, Jan D'Haen, Marc D'Olieslaeger, Luc De Schepper, O. Vendier, H. Blanck, D. Pons: Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. Microelectronics Reliability 42(9-11): 1359-1363 (2002)
1	EE	E. Andries, R. Dreesen, K. Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen: Statistical aspects of the degradation of LDD nMOSFETs. Microelectronics Reliability 42(9-11): 1409-1413 (2002)

Coauthor Index

1	E. Andries	[1]
2	S. Aresu	[3]
3	H. Blanck	[2]
4	Ward De Ceuninck	[1] [2] [3]
5	K. Croes	[1]
6	Marc D'Olieslaeger	[1] [2] [3]
7	Robin Degraeve	[3]
8	R. Dreesen	[1]
9	Guido Groeseneken	[1]
10	Ben Kaczer	[3]
11	G. Knuyt	[3]
12	K. F. Lo	[1]
13	J. Manca	[3]
14	J. Mertens	[3]
15	R. Petersen	[2]
16	D. Pons	[2]
17	Luc De Schepper	[1] [2] [3]
18	O. Vendier	[2]