| |
| 2002 | ||
|---|---|---|
| 1 | EE | Kazuhiko Iijima, Armagan Akar, Charlie McDonald, Dwayne Burek: Embedded Test Solution as a Breakthrough in Reducing Cost of Test for System on Chips. Asian Test Symposium 2002: 311-316 |
| 1 | Armagan Akar | [1] |
| 2 | Dwayne Burek | [1] |
| 3 | Kazuhiko Iijima | [1] |