| 1993 |
|---|
| 9 | | Hans Bouwmeester,
Steven Oostdijk,
Frank Bouwman,
Rudi Stans,
Loek Thijssen,
Frans P. M. Beenker:
Minimizing Test Time by Exploiting Parallelism in Macro Test.
ITC 1993: 451-460 |
| 1992 |
|---|
| 8 | | Frank Bouwman,
Steven Oostdijk,
Rudi Stans,
Ben Bennetts,
Frans P. M. Beenker:
Macro Testability: The Results of Production Device Applications.
ITC 1992: 232-241 |
| 1990 |
|---|
| 7 | EE | Frans P. M. Beenker,
Barry J. Dekker,
Richard Stans,
Max Van der Star:
Implementing Macro Test in Silicon Compiler Design.
IEEE Design & Test of Computers 7(2): 41-51 (1990) |
| 6 | EE | Rob Dekker,
Frans P. M. Beenker,
Loek Thijssen:
A realistic fault model and test algorithms for static random access memories.
IEEE Trans. on CAD of Integrated Circuits and Systems 9(6): 567-572 (1990) |
| 1989 |
|---|
| 5 | | Frans P. M. Beenker,
Rob Dekker,
Rudi Stans,
Max Van der Star:
A Testability Strategy for Silicon Compilers.
ITC 1989: 660-669 |
| 1988 |
|---|
| 4 | | Frans P. M. Beenker,
Rob Dekker,
Loek Thijssen:
Fault Modeling and Test Algorithm Development.
ITC 1988: 343-352 |
| 3 | | Frans P. M. Beenker,
Rob Dekker,
Loek Thijssen:
A Realistic Self-Test Machine for Static Random Access Memories.
ITC 1988: 353-361 |
| 1986 |
|---|
| 2 | EE | Michiel M. Ligthart,
Emile H. L. Aarts,
Frans P. M. Beenker:
Design-for-testability of PLA's using statistical cooling.
DAC 1986: 339-345 |
| 1985 |
|---|
| 1 | | Frans P. M. Beenker:
Systematic and Structured Methods for Digital Board Testing.
ITC 1985: 380-385 |
