| |
| 1993 | ||
|---|---|---|
| 1 | Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker: Minimizing Test Time by Exploiting Parallelism in Macro Test. ITC 1993: 451-460 | |
| 1 | Frans P. M. Beenker | [1] |
| 2 | Frank Bouwman | [1] |
| 3 | Steven Oostdijk | [1] |
| 4 | Rudi Stans | [1] |
| 5 | Loek Thijssen | [1] |