| 2004 |
|---|
| 4 | EE | Sandeep Kumar Goel,
Kuoshu Chiu,
Erik Jan Marinissen,
Toan Nguyen,
Steven Oostdijk:
Test Infrastructure Design for the Nexperia? Home Platform PNX8550 System Chip.
DATE 2004: 108-113 |
| 2001 |
|---|
| 3 | | Bart Vermeulen,
Steven Oostdijk,
Frank Bouwman:
Test and debug strategy of the PNX8525 NexperiaTM digital video platform system chip.
ITC 2001: 121-130 |
| 1993 |
|---|
| 2 | | Hans Bouwmeester,
Steven Oostdijk,
Frank Bouwman,
Rudi Stans,
Loek Thijssen,
Frans P. M. Beenker:
Minimizing Test Time by Exploiting Parallelism in Macro Test.
ITC 1993: 451-460 |
| 1992 |
|---|
| 1 | | Frank Bouwman,
Steven Oostdijk,
Rudi Stans,
Ben Bennetts,
Frans P. M. Beenker:
Macro Testability: The Results of Production Device Applications.
ITC 1992: 232-241 |
