| 1993 |
|---|
| 4 | | Hans Bouwmeester,
Steven Oostdijk,
Frank Bouwman,
Rudi Stans,
Loek Thijssen,
Frans P. M. Beenker:
Minimizing Test Time by Exploiting Parallelism in Macro Test.
ITC 1993: 451-460 |
| 1990 |
|---|
| 3 | EE | Rob Dekker,
Frans P. M. Beenker,
Loek Thijssen:
A realistic fault model and test algorithms for static random access memories.
IEEE Trans. on CAD of Integrated Circuits and Systems 9(6): 567-572 (1990) |
| 1988 |
|---|
| 2 | | Frans P. M. Beenker,
Rob Dekker,
Loek Thijssen:
Fault Modeling and Test Algorithm Development.
ITC 1988: 343-352 |
| 1 | | Frans P. M. Beenker,
Rob Dekker,
Loek Thijssen:
A Realistic Self-Test Machine for Static Random Access Memories.
ITC 1988: 353-361 |
