| |
| 1993 | ||
|---|---|---|
| 3 | Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker: Minimizing Test Time by Exploiting Parallelism in Macro Test. ITC 1993: 451-460 | |
| 1992 | ||
| 2 | Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker: Macro Testability: The Results of Production Device Applications. ITC 1992: 232-241 | |
| 1989 | ||
| 1 | Frans P. M. Beenker, Rob Dekker, Rudi Stans, Max Van der Star: A Testability Strategy for Silicon Compilers. ITC 1989: 660-669 | |
| 1 | Frans P. M. Beenker | [1] [2] [3] |
| 2 | Ben Bennetts (R. G. Bennetts) | [2] |
| 3 | Frank Bouwman | [2] [3] |
| 4 | Hans Bouwmeester | [3] |
| 5 | Rob Dekker | [1] |
| 6 | Steven Oostdijk | [2] [3] |
| 7 | Max Van der Star | [1] |
| 8 | Loek Thijssen | [3] |