| |
| 1990 | ||
|---|---|---|
| 4 | EE | Rob Dekker, Frans P. M. Beenker, Loek Thijssen: A realistic fault model and test algorithms for static random access memories. IEEE Trans. on CAD of Integrated Circuits and Systems 9(6): 567-572 (1990) |
| 1989 | ||
| 3 | Frans P. M. Beenker, Rob Dekker, Rudi Stans, Max Van der Star: A Testability Strategy for Silicon Compilers. ITC 1989: 660-669 | |
| 1988 | ||
| 2 | Frans P. M. Beenker, Rob Dekker, Loek Thijssen: Fault Modeling and Test Algorithm Development. ITC 1988: 343-352 | |
| 1 | Frans P. M. Beenker, Rob Dekker, Loek Thijssen: A Realistic Self-Test Machine for Static Random Access Memories. ITC 1988: 353-361 | |
| 1 | Frans P. M. Beenker | [1] [2] [3] [4] |
| 2 | Rudi Stans | [3] |
| 3 | Max Van der Star | [3] |
| 4 | Loek Thijssen | [1] [2] [4] |