| 2007 |
|---|
| 3 | EE | Hiroyuki Michinishi,
Tokumi Yokohira,
Takuji Okamoto,
Toshifumi Kobayashi,
Tsutomu Hondo:
Detection of CMOS Open Node Defects by Frequency Analysis.
IEICE Transactions 90-D(3): 685-687 (2007) |
| 2003 |
|---|
| 2 | EE | Hiroyuki Michinishi,
Tokumi Yokohira,
Takuji Okamoto,
Toshifumi Kobayashi,
Tsutomu Hondo:
Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test.
Asian Test Symposium 2003: 406-411 |
| 2002 |
|---|
| 1 | EE | Hiroyuki Michinishi,
Tokumi Yokohira,
Takuji Okamoto,
Toshifumi Kobayashi,
Tsutomu Hondo:
CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply.
Asian Test Symposium 2002: 417-422 |
