Hei Wong

2007
13	EE	Hei Wong, V. Filip, C. K. Wong, P. S. Chung: Silicon integrated photonics begins to revolutionize. Microelectronics Reliability 47(1): 1-10 (2007)
12	EE	Sergey Shaimeev, Vladimir Gritsenko, Kaupo Kukli, Hei Wong, Eun-Hong Lee, Chungwoo Kim: Single band electronic conduction in hafnium oxide prepared by atomic layer deposition. Microelectronics Reliability 47(1): 36-40 (2007)
2006
11	EE	V. Filip, Hei Wong, D. Nicolaescu: Definition of curve fitting parameter to study tunneling and trapping of electrons in Si/ultra-thin SiO2/metal structures. Microelectronics Reliability 46(7): 1027-1034 (2006)
2005
10	EE	Nian Zhan, M. C. Poon, Hei Wong, K. L. Ng, C. W. Kok: Dielectric breakdown characteristics and interface trapping of hafnium oxide films. Microelectronics Journal 36(1): 29-33 (2005)
2003
9	EE	Hei Wong: Low-frequency noise study in electron devices: review and update. Microelectronics Reliability 43(4): 585-599 (2003)
8	EE	Jackie Chan, Hei Wong, M. C. Poon, C. W. Kok: Oxynitride gate dielectric prepared by thermal oxidation of low-pressure chemical vapor deposition silicon-rich silicon nitride. Microelectronics Reliability 43(4): 611-616 (2003)
7	EE	V. A. Gritsenko, A. V. Shaposhnikov, Yu. N. Novikov, A. P. Baraban, Hei Wong, G. M. Zhidomirov, M. Roger: Onefold coordinated oxygen atom: an electron trap in the silicon oxide. Microelectronics Reliability 43(4): 665-669 (2003)
6	EE	K. L. Ng, Nian Zhan, C. W. Kok, M. C. Poon, Hei Wong: Electrical characterization of the hafnium oxide prepared by direct sputtering of Hf in oxygen with rapid thermal annealing. Microelectronics Reliability 43(8): 1289-1293 (2003)
2002
5	EE	Hei Wong: Recent developments in silicon optoelectronic devices. Microelectronics Reliability 42(3): 317-326 (2002)
4	EE	Hei Wong, V. A. Gritsenko: Defects in silicon oxynitride gate dielectric films. Microelectronics Reliability 42(4-5): 597-605 (2002)
3	EE	P. G. Han, Hei Wong, Andy H. P. Chan, M. C. Poon: A novel approach for fabricating light-emitting porous polysilicon films. Microelectronics Reliability 42(6): 929-933 (2002)
2001
2	EE	M. C. Poon, Y. Gao, T. C. W. Kok, A. M. Myasnikov, Hei Wong: SIMS study of silicon oxynitride prepared by oxidation of silicon-rich silicon nitride layer. Microelectronics Reliability 41(12): 2071-2074 (2001)
1	EE	Hei Wong, P. G. Han, M. C. Poon, Y. Gao: Investigation of the surface silica layer on porous poly-Si thin films. Microelectronics Reliability 41(2): 179-184 (2001)

Coauthor Index

1	A. P. Baraban	[7]
2	Andy H. P. Chan	[3]
3	Jackie Chan	[8]
4	P. S. Chung	[13]
5	V. Filip	[11] [13]
6	Y. Gao	[1] [2]
7	V. A. Gritsenko	[4] [7]
8	Vladimir Gritsenko	[12]
9	P. G. Han	[1] [3]
10	Chungwoo Kim	[12]
11	C. W. Kok	[6] [8] [10]
12	T. C. W. Kok	[2]
13	Kaupo Kukli	[12]
14	Eun-Hong Lee	[12]
15	A. M. Myasnikov	[2]
16	K. L. Ng	[6] [10]
17	D. Nicolaescu	[11]
18	Yu. N. Novikov	[7]
19	M. C. Poon	[1] [2] [3] [6] [8] [10]
20	M. Roger	[7]
21	Sergey Shaimeev	[12]
22	A. V. Shaposhnikov	[7]
23	Chak-Kuen Wong (C. K. Wong)	[13]
24	Nian Zhan	[6] [10]
25	G. M. Zhidomirov	[7]

Colors in the list of coauthors