V. A. Gritsenko

2003
2	EE	V. A. Gritsenko, A. V. Shaposhnikov, Yu. N. Novikov, A. P. Baraban, Hei Wong, G. M. Zhidomirov, M. Roger: Onefold coordinated oxygen atom: an electron trap in the silicon oxide. Microelectronics Reliability 43(4): 665-669 (2003)
2002
1	EE	Hei Wong, V. A. Gritsenko: Defects in silicon oxynitride gate dielectric films. Microelectronics Reliability 42(4-5): 597-605 (2002)

Coauthor Index

1	A. P. Baraban	[2]
2	Yu. N. Novikov	[2]
3	M. Roger	[2]
4	A. V. Shaposhnikov	[2]
5	Hei Wong	[1] [2]
6	G. M. Zhidomirov	[2]