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| 2006 | ||
|---|---|---|
| 1 | EE | V. Filip, Hei Wong, D. Nicolaescu: Definition of curve fitting parameter to study tunneling and trapping of electrons in Si/ultra-thin SiO2/metal structures. Microelectronics Reliability 46(7): 1027-1034 (2006) |
| 1 | V. Filip | [1] |
| 2 | Hei Wong | [1] |