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B. Poussard

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2005
1EES. Mellé, D. De Conto, L. Mazenq, D. Dubuc, B. Poussard, C. Bordas, K. Grenier, L. Bary, O. Vendier, J. L. Muraro: Failure predictive model of capacitive RF-MEMS. Microelectronics Reliability 45(9-11): 1770-1775 (2005)

Coauthor Index

1L. Bary [1]
2C. Bordas [1]
3D. De Conto [1]
4D. Dubuc [1]
5K. Grenier [1]
6L. Mazenq [1]
7S. Mellé [1]
8J. L. Muraro [1]
9O. Vendier [1]

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