J. L. Muraro

2005
2	EE	N. Ismail, N. Malbert, N. Labat, A. Touboul, J. L. Muraro, F. Brasseau, D. Langrez: Safe operating area of GaAs MESFET and PHEMT for amplification in overdrive operating conditions. Microelectronics Reliability 45(9-11): 1611-1616 (2005)
1	EE	S. Mellé, D. De Conto, L. Mazenq, D. Dubuc, B. Poussard, C. Bordas, K. Grenier, L. Bary, O. Vendier, J. L. Muraro: Failure predictive model of capacitive RF-MEMS. Microelectronics Reliability 45(9-11): 1770-1775 (2005)

Coauthor Index

1	L. Bary	[1]
2	C. Bordas	[1]
3	F. Brasseau	[2]
4	D. De Conto	[1]
5	D. Dubuc	[1]
6	K. Grenier	[1]
7	N. Ismail	[2]
8	N. Labat	[2]
9	D. Langrez	[2]
10	N. Malbert	[2]
11	L. Mazenq	[1]
12	S. Mellé	[1]
13	B. Poussard	[1]
14	A. Touboul	[2]
15	O. Vendier	[1]

Colors in the list of coauthors