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J. L. Muraro

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2005
2EEN. Ismail, N. Malbert, N. Labat, A. Touboul, J. L. Muraro, F. Brasseau, D. Langrez: Safe operating area of GaAs MESFET and PHEMT for amplification in overdrive operating conditions. Microelectronics Reliability 45(9-11): 1611-1616 (2005)
1EES. Mellé, D. De Conto, L. Mazenq, D. Dubuc, B. Poussard, C. Bordas, K. Grenier, L. Bary, O. Vendier, J. L. Muraro: Failure predictive model of capacitive RF-MEMS. Microelectronics Reliability 45(9-11): 1770-1775 (2005)

Coauthor Index

1L. Bary [1]
2C. Bordas [1]
3F. Brasseau [2]
4D. De Conto [1]
5D. Dubuc [1]
6K. Grenier [1]
7N. Ismail [2]
8N. Labat [2]
9D. Langrez [2]
10N. Malbert [2]
11L. Mazenq [1]
12S. Mellé [1]
13B. Poussard [1]
14A. Touboul [2]
15O. Vendier [1]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)