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R. B. R. van Silfhout

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2007
3EEM. A. J. van Gils, W. D. van Driel, G. Q. Zhang, H. J. L. Bressers, R. B. R. van Silfhout, X. J. Fan, J. H. J. Janssen: Virtual qualification of moisture induced failures of advanced packages. Microelectronics Reliability 47(2-3): 273-279 (2007)
2006
2EEC. Yuan, W. D. van Driel, R. B. R. van Silfhout, O. van der Sluis, R. A. B. Engelen, L. J. Ernst, F. van Keulen, G. Q. Zhang: Delamination analysis of Cu/low-k technology subjected to chemical-mechanical polishing process conditions. Microelectronics Reliability 46(9-11): 1679-1684 (2006)
2005
1EEW. D. van Driel, M. A. J. van Gils, R. B. R. van Silfhout, G. Q. Zhang: Prediction of Delamination Related IC & Packaging Reliability Problems. Microelectronics Reliability 45(9-11): 1633-1638 (2005)

Coauthor Index

1H. J. L. Bressers [3]
2W. D. van Driel [1] [2] [3]
3R. A. B. Engelen [2]
4L. J. Ernst [2]
5X. J. Fan [3]
6M. A. J. van Gils [1] [3]
7J. H. J. Janssen [3]
8F. van Keulen [2]
9O. van der Sluis [2]
10C. Yuan [2]
11G. Q. Zhang [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)