| |
| 2003 | ||
|---|---|---|
| 1 | EE | Won-Seok Lee, Keun-Ho Lee, Jin-Kyu Park, Tae-Kyung Kim, Young-Kwan Park, Jeong-Taek Kong: Investigation of the capacitance deviation due to metal-fills and the effective interconnect geometry modeling. ISQED 2003: 373-376 |
| 1 | Tae-Kyung Kim | [1] |
| 2 | Jeong-Taek Kong | [1] |
| 3 | Keun-Ho Lee | [1] |
| 4 | Jin-Kyu Park | [1] |
| 5 | Young-Kwan Park | [1] |