| |
| 2001 | ||
|---|---|---|
| 2 | EE | Tae-Jin Kwon, Sang-Hoon Lee, Tae-Seon Kim, Hoe-Jin Lee, Young-Kwan Park, Taek-Soo Kim, Seok-Jin Kim, Jeong-Taek Kong: Performance Improvement for High Speed Devices Using E-tests and the SPICE Model. ISQED 2001: 443- |
| 2000 | ||
| 1 | EE | Kwan-Do Kim, Young-Kwan Park, Jun-Ha Lee, Jeong-Taek Kong, Hee-Sung Kang, Young-Wug Kim, Seok-Jin Kim: Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's. ISQED 2000: 87- |
| 1 | Hee-Sung Kang | [1] |
| 2 | Kwan-Do Kim | [1] |
| 3 | Tae-Seon Kim | [2] |
| 4 | Taek-Soo Kim | [2] |
| 5 | Young-Wug Kim | [1] |
| 6 | Jeong-Taek Kong | [1] [2] |
| 7 | Tae-Jin Kwon | [2] |
| 8 | Hoe-Jin Lee | [2] |
| 9 | Jun-Ha Lee | [1] |
| 10 | Sang-Hoon Lee | [2] |
| 11 | Young-Kwan Park | [1] [2] |