| |
| 2002 | ||
|---|---|---|
| 1 | EE | Jin-Kyu Park, Keun-Ho Lee, Chang-Sub Lee, Gi-Young Yang, Young-Kwan Park, Jeong-Taek Kong: Characterizing the Current Degradation of Abnormally Structured MOS Transistors Using a 3D Poisson Solver. ISQED 2002: 322-325 |
| 1 | Jeong-Taek Kong | [1] |
| 2 | Chang-Sub Lee | [1] |
| 3 | Keun-Ho Lee | [1] |
| 4 | Jin-Kyu Park | [1] |
| 5 | Young-Kwan Park | [1] |