| |
| 2000 | ||
|---|---|---|
| 1 | EE | Kwan-Do Kim, Young-Kwan Park, Jun-Ha Lee, Jeong-Taek Kong, Hee-Sung Kang, Young-Wug Kim, Seok-Jin Kim: Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's. ISQED 2000: 87- |
| 1 | Hee-Sung Kang | [1] |
| 2 | Kwan-Do Kim | [1] |
| 3 | Seok-Jin Kim | [1] |
| 4 | Young-Wug Kim | [1] |
| 5 | Jeong-Taek Kong | [1] |
| 6 | Young-Kwan Park | [1] |