| |
| 2003 | ||
|---|---|---|
| 1 | EE | M. Zecri, P. Besse, P. Givelin, M. Nayrolles, M. Bafleur, N. Nolhier: Determination of the ESD Failure Cause Through its Signature. Microelectronics Reliability 43(9-11): 1551-1556 (2003) |
| 1 | M. Bafleur | [1] |
| 2 | P. Besse | [1] |
| 3 | M. Nayrolles | [1] |
| 4 | N. Nolhier | [1] |
| 5 | M. Zecri | [1] |