M. Zecri

2003
2	EE	M. Zecri, P. Besse, P. Givelin, M. Nayrolles, M. Bafleur, N. Nolhier: Determination of the ESD Failure Cause Through its Signature. Microelectronics Reliability 43(9-11): 1551-1556 (2003)
2002
1	EE	O. Perat, J. M. Dorkel, E. Scheid, Pierre Temple-Boyer, Y. S. Chung, A. Peyre-Lavigne, M. Zecri, P. Tounsi: Characterization method of thermomechanical parameters for microelectronic materials. Microelectronics Reliability 42(7): 1053-1058 (2002)

Coauthor Index

1	M. Bafleur	[2]
2	P. Besse	[2]
3	Y. S. Chung	[1]
4	J. M. Dorkel	[1]
5	P. Givelin	[2]
6	M. Nayrolles	[2]
7	N. Nolhier	[2]
8	O. Perat	[1]
9	A. Peyre-Lavigne	[1]
10	E. Scheid	[1]
11	Pierre Temple-Boyer	[1]
12	P. Tounsi	[1]

Colors in the list of coauthors