2005 |
3 | EE | Hiroyuki Nakamura,
Akio Shirokane,
Yoshihito Nishizaki,
Anis Uzzaman,
Vivek Chickermane,
Brion L. Keller,
Tsutomu Ube,
Yoshihiko Terauchi:
Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression.
Asian Test Symposium 2005: 156-161 |
2003 |
2 | EE | Yoshihito Nishizaki,
Osamu Nakayama,
Chiaki Matsumoto,
Yoshitaka Kimura,
Toshimi Kobayashi,
Hiroyuki Nakamura:
Testing DSM ASIC With Static, \DeltaIDDQ, And Dynamic Test Suite: Implementation And Results.
ITC 2003: 85-94 |
1990 |
1 | EE | Rajeev Murgai,
Yoshihito Nishizaki,
Narendra V. Shenoy,
Robert K. Brayton,
Alberto L. Sangiovanni-Vincentelli:
Logic Synthesis for Programmable Gate Arrays.
DAC 1990: 620-625 |