Anis Uzzaman

2005
2	EE	Hiroyuki Nakamura, Akio Shirokane, Yoshihito Nishizaki, Anis Uzzaman, Vivek Chickermane, Brion L. Keller, Tsutomu Ube, Yoshihiko Terauchi: Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression. Asian Test Symposium 2005: 156-161
1	EE	Vivek Chickermane, Brion L. Keller, Kevin McCauley, Anis Uzzaman: Practical Aspects of Delay Testing for Nanometer Chips. Asian Test Symposium 2005: 470

Coauthor Index

1	Vivek Chickermane	[1] [2]
2	Brion L. Keller	[1] [2]
3	Kevin McCauley	[1]
4	Hiroyuki Nakamura	[2]
5	Yoshihito Nishizaki	[2]
6	Akio Shirokane	[2]
7	Yoshihiko Terauchi	[2]
8	Tsutomu Ube	[2]