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Anis Uzzaman

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2005
2EEHiroyuki Nakamura, Akio Shirokane, Yoshihito Nishizaki, Anis Uzzaman, Vivek Chickermane, Brion L. Keller, Tsutomu Ube, Yoshihiko Terauchi: Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression. Asian Test Symposium 2005: 156-161
1EEVivek Chickermane, Brion L. Keller, Kevin McCauley, Anis Uzzaman: Practical Aspects of Delay Testing for Nanometer Chips. Asian Test Symposium 2005: 470

Coauthor Index

1Vivek Chickermane [1] [2]
2Brion L. Keller [1] [2]
3Kevin McCauley [1]
4Hiroyuki Nakamura [2]
5Yoshihito Nishizaki [2]
6Akio Shirokane [2]
7Yoshihiko Terauchi [2]
8Tsutomu Ube [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)