2003 | ||
---|---|---|
2 | EE | Yoshihito Nishizaki, Osamu Nakayama, Chiaki Matsumoto, Yoshitaka Kimura, Toshimi Kobayashi, Hiroyuki Nakamura: Testing DSM ASIC With Static, \DeltaIDDQ, And Dynamic Test Suite: Implementation And Results. ITC 2003: 85-94 |
1994 | ||
1 | EE | Osamu Nakayama, Shinji Kobayashi, Katsuyuki Omura, Takahiro Asai, Mitsuhiro Tomoda, Teruki Kamada: Development of Surface Inspection Machine for Organic Photo Conductor(OPC). MVA 1994: 490-493 |
1 | Takahiro Asai | [1] |
2 | Teruki Kamada | [1] |
3 | Yoshitaka Kimura | [2] |
4 | Shinji Kobayashi | [1] |
5 | Toshimi Kobayashi | [2] |
6 | Chiaki Matsumoto | [2] |
7 | Hiroyuki Nakamura | [2] |
8 | Yoshihito Nishizaki | [2] |
9 | Katsuyuki Omura | [1] |
10 | Mitsuhiro Tomoda | [1] |