Akio Shirokane

2005
1	EE	Hiroyuki Nakamura, Akio Shirokane, Yoshihito Nishizaki, Anis Uzzaman, Vivek Chickermane, Brion L. Keller, Tsutomu Ube, Yoshihiko Terauchi: Low Cost Delay Testing of Nanometer SoCs Using On-Chip Clocking and Test Compression. Asian Test Symposium 2005: 156-161

Coauthor Index

1	Vivek Chickermane	[1]
2	Brion L. Keller	[1]
3	Hiroyuki Nakamura	[1]
4	Yoshihito Nishizaki	[1]
5	Yoshihiko Terauchi	[1]
6	Tsutomu Ube	[1]
7	Anis Uzzaman	[1]