2003 | ||
---|---|---|
1 | EE | Yoshihito Nishizaki, Osamu Nakayama, Chiaki Matsumoto, Yoshitaka Kimura, Toshimi Kobayashi, Hiroyuki Nakamura: Testing DSM ASIC With Static, \DeltaIDDQ, And Dynamic Test Suite: Implementation And Results. ITC 2003: 85-94 |
1 | Toshimi Kobayashi | [1] |
2 | Chiaki Matsumoto | [1] |
3 | Hiroyuki Nakamura | [1] |
4 | Osamu Nakayama | [1] |
5 | Yoshihito Nishizaki | [1] |