| |
| 2001 | ||
|---|---|---|
| 1 | EE | M. Da Rold, E. Simoen, Sofie Mertens, Marc Schaekers, G. Badenes, Stefaan Decoutere: Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS. Microelectronics Reliability 41(12): 1933-1938 (2001) |
| 1 | G. Badenes | [1] |
| 2 | Stefaan Decoutere | [1] |
| 3 | Sofie Mertens | [1] |
| 4 | Marc Schaekers | [1] |
| 5 | E. Simoen | [1] |