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2001 | ||
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2 | EE | M. Da Rold, E. Simoen, Sofie Mertens, Marc Schaekers, G. Badenes, Stefaan Decoutere: Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS. Microelectronics Reliability 41(12): 1933-1938 (2001) |
1 | EE | Kai F. Dombrowski, B. Dietrich, I. De Wolf, R. Rooyackers, G. Badenes: Investigation of stress in shallow trench isolation using UV micro-Raman spectroscopy. Microelectronics Reliability 41(4): 511-515 (2001) |
1 | Stefaan Decoutere | [2] |
2 | B. Dietrich | [1] |
3 | Kai F. Dombrowski | [1] |
4 | Sofie Mertens | [2] |
5 | M. Da Rold | [2] |
6 | R. Rooyackers | [1] |
7 | Marc Schaekers | [2] |
8 | E. Simoen | [2] |
9 | I. De Wolf | [1] |