| |
| 2001 | ||
|---|---|---|
| 2 | EE | M. Da Rold, E. Simoen, Sofie Mertens, Marc Schaekers, G. Badenes, Stefaan Decoutere: Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS. Microelectronics Reliability 41(12): 1933-1938 (2001) |
| 1 | EE | Kai F. Dombrowski, B. Dietrich, I. De Wolf, R. Rooyackers, G. Badenes: Investigation of stress in shallow trench isolation using UV micro-Raman spectroscopy. Microelectronics Reliability 41(4): 511-515 (2001) |
| 1 | Stefaan Decoutere | [2] |
| 2 | B. Dietrich | [1] |
| 3 | Kai F. Dombrowski | [1] |
| 4 | Sofie Mertens | [2] |
| 5 | M. Da Rold | [2] |
| 6 | R. Rooyackers | [1] |
| 7 | Marc Schaekers | [2] |
| 8 | E. Simoen | [2] |
| 9 | I. De Wolf | [1] |